WAM: Wear wear-out-aware memory management for SCRAM-based...

WAM: Wear wear-out-aware memory management for SCRAM-based low power mobile systems

Seo, Dongyoung, Shin, Dongkun
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Volume:
59
Language:
english
Journal:
IEEE Transactions on Consumer Electronics
DOI:
10.1109/tce.2013.6689692
Date:
November, 2013
File:
PDF, 3.50 MB
english, 2013
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