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Novel profiling model and side effects of helical scan silicon heads
Hozoi, A., Groenland, J.P.J., Albertini, J.B., Lodder, J.C.Volume:
38
Language:
english
Journal:
IEEE Transactions on Magnetics
DOI:
10.1109/tmag.2002.802811
Date:
September, 2002
File:
PDF, 267 KB
english, 2002