[IEEE 23rd International Reliability Physics Symposium -...

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[IEEE 23rd International Reliability Physics Symposium - Orlando, FL, USA (1985.03.25-1985.03.29)] 23rd International Reliability Physics Symposium - Moisture Resistance of Polyimide Multilevel Interconnect LSI's

Nishida, Takashi, Mukai, Kiichiro, Inaba, Tohru, Kato, Tokio, Tezuka, Izumi, Horie, Noboru
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Year:
1985
Language:
english
DOI:
10.1109/irps.1985.362090
File:
PDF, 4.65 MB
english, 1985
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