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[IEEE 2011 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2011.10.16-2011.10.20)] 2011 IEEE International Integrated Reliability Workshop Final Report - User verify and disturb mechanisms in a 65nm flash FPGA
Jia, James Yingbo, Singaraju, Pavan, Dhaoui, Fethi, Newell, Rich, Liu, Patty, Micael, Habtom, Traas, Michael, Sammie, Salim, Wang, J. J., Hawley, Frank, McCollum, John, den Abeelen Werner, Van, Hamdy,Year:
2011
Language:
english
DOI:
10.1109/iirw.2011.6142586
File:
PDF, 306 KB
english, 2011