[IEEE ESSDERC 2013 - 43rd European Solid State Device...

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[IEEE ESSDERC 2013 - 43rd European Solid State Device Research Conference - Bucharest, Romania (2013.09.16-2013.09.20)] 2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - Reliability tests for discriminating between technological variants of QFN packaging

Bazu, Marius, Ilian, Virgil Emil, Varsescu, Dragos, Galateanu, Lucian, Sikio, Vili, Reimets, Meelis, Uhl, Volker, Weiss, Manuel
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Year:
2013
Language:
english
DOI:
10.1109/essderc.2013.6818860
File:
PDF, 678 KB
english, 2013
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