![](/img/cover-not-exists.png)
[IEEE ESSDERC 2013 - 43rd European Solid State Device Research Conference - Bucharest, Romania (2013.09.16-2013.09.20)] 2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - Reliability tests for discriminating between technological variants of QFN packaging
Bazu, Marius, Ilian, Virgil Emil, Varsescu, Dragos, Galateanu, Lucian, Sikio, Vili, Reimets, Meelis, Uhl, Volker, Weiss, ManuelYear:
2013
Language:
english
DOI:
10.1109/essderc.2013.6818860
File:
PDF, 678 KB
english, 2013