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[IEEE IEEE Radio Frequency Integrated Circuits Symposium (RFIC) - Philadelphia, PA, USA (8-10 June 2003)] IEEE Radio Frequency Integrated Circuits (RFIC) Symposium, 2003 - Reliability evaluation of voltage controlled oscillators based on a device degradation sub-circuit model
Wei-Cheng Lin,, Long-Jei Du,, Ya-Chin King,Year:
2003
Language:
english
DOI:
10.1109/rfic.2003.1213966
File:
PDF, 249 KB
english, 2003