[IEEE Comput. Soc. Press IEEE Conference on Computer Vision and Pattern Recognition - San Francisco, CA, USA (18-20 June 1996)] Proceedings CVPR IEEE Computer Society Conference on Computer Vision and Pattern Recognition - Competitive mixture of deformable models for pattern classification
Kwok-Wai Cheung,, Dit-Yan Yeung,, Chin, R.T.Year:
1996
Language:
english
DOI:
10.1109/cvpr.1996.517136
File:
PDF, 569 KB
english, 1996