High-energy x-ray reflectivity of buried interfaces created by wafer bonding
Rieutord, F., Eymery, J., Fournel, F., Buttard, D., Oeser, R., Plantevin, O., Moriceau, H., Aspar, B.Volume:
63
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.63.125408
Date:
March, 2001
File:
PDF, 141 KB
english, 2001