[IEEE 2013 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW) - Pasadena, CA, USA (2013.11.4-2013.11.7)] 2013 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW) - Smart defect classification for better analysis using tagging mechanisms
Meena, Seema, Balasubramani, Uma MYear:
2013
Language:
english
DOI:
10.1109/issrew.2013.6688871
File:
PDF, 193 KB
english, 2013