[IEEE 2011 International Conference on Microelectronic Test Structures (ICMTS) - Amsterdam, Netherlands (2011.04.4-2011.04.7)] 2011 IEEE ICMTS International Conference on Microelectronic Test Structures - Nonlinear network analyzer measurements for better transistor modeling
Sischka, FranzYear:
2011
Language:
english
DOI:
10.1109/icmts.2011.5976867
File:
PDF, 420 KB
english, 2011