[IEEE Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03 - Xi'an, China (2003.11.19-2003.11.19)] Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03 - Exhaustive test of several dependable memory architectures designed by GRAAL tool
Bertuccelli,, Bigongiari,, Brogna,, Di Natale,, Prinetto,, Saletti,Year:
2003
Language:
english
DOI:
10.1109/ats.2003.1250779
File:
PDF, 489 KB
english, 2003