SET Emulation Considering Electrical Masking Effects
Entrena, Luis, Valderas, Mario GarcÍa, Cardenal, RaÚl FernÁndez, Garcia, Marta Portela, Ongil, Celia LÓpezVolume:
56
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2009.2013346
Date:
August, 2009
File:
PDF, 297 KB
english, 2009