[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Novel Robust High Voltage ESD Clamps for LDMOS Protection
Walker, A.J., Ward, S.T., Puchner, H.Year:
2007
Language:
english
DOI:
10.1109/relphy.2007.369968
File:
PDF, 784 KB
english, 2007