[IEEE 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07) - Bangalore, India (2007.01.6-2007.01.10)] 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07) - Model Based Test Generation for Microprocessor Architecture Validation
Kodakara, Sreekumar, Mathaikutty, Deepak, Dingankar, Ajit, Shukla, Sandeep, Lilja, DavidYear:
2007
Language:
english
DOI:
10.1109/vlsid.2007.108
File:
PDF, 309 KB
english, 2007