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[IEEE 21st International Reliability Physics Symposium - Phoenix, AZ, USA (1983.04.5-1983.04.7)] 21st International Reliability Physics Symposium - The Effect of Entrapped Krypton 85 Gas on Device Reliability
Fisch, David, Mozdzen, Tom, Roberts, GerowYear:
1983
Language:
english
DOI:
10.1109/irps.1983.361968
File:
PDF, 3.36 MB
english, 1983