[IEEE 2003 Winter Simulation Conference - New Orleans, LA, USA (7-10 Dec. 2003)] Proceedings of the 2003 International Conference on Machine Learning and Cybernetics (IEEE Cat. No.03EX693) - Simulation-based assessment of batching heuristics in semiconductor manufacturing
Monch, L., Habenicht, I.Year:
2003
Language:
english
DOI:
10.1109/wsc.2003.1261570
File:
PDF, 532 KB
english, 2003