[IEEE 2008 26th International Conference on...

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[IEEE 2008 26th International Conference on Microelectronics (MIEL 2008) - Nis, Serbia and Montenegro (2008.05.11-2008.05.14)] 2008 26th International Conference on Microelectronics - Modeling of nanoscale GaN FET in a compact 2-D model with gate stack effects

Tyagi, Rajesh K., Ahlawat, Anil, Pandey, Manoj, Pandey, Sujata
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Year:
2008
Language:
english
DOI:
10.1109/icmel.2008.4559265
File:
PDF, 221 KB
english, 2008
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