[IEEE 2010 17th IEEE International Conference on Image Processing (ICIP 2010) - Hong Kong, Hong Kong (2010.09.26-2010.09.29)] 2010 IEEE International Conference on Image Processing - HTF: a novel feature for general crack detection
Hu, Han, Gu, Quanquan, Zhou, JieYear:
2010
Language:
english
DOI:
10.1109/icip.2010.5653171
File:
PDF, 790 KB
english, 2010