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[IEEE Comput. Soc. Press International Test Conference 1988 Proceeding@m_New Frontiers in Testing - Washington, DC, USA (12-14 Sept. 1988)] International Test Conference 1988 Proceeding@m_New Frontiers in Testing - Switch-level concurrent fault simulation based on a general purpose list traversal mechanism
Machlin, D., Gross, D., Kadkade, S., Ulrich, E.Year:
1988
Language:
english
DOI:
10.1109/test.1988.207839
File:
PDF, 643 KB
english, 1988