[IEEE 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (2006.7.3-2006.7.3)] 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Lead frame Hillock-Induced Silicon Crack
Flores, R.C., Fabia, M.G., Nabong, M.T., Soria, A.O., Gabunas, C.B.Year:
2006
Language:
english
DOI:
10.1109/ipfa.2006.251040
File:
PDF, 2.91 MB
english, 2006