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[IEEE Systems (DDECS) - Cottbus, Germany (2011.04.13-2011.04.15)] 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems - Increasing the efficiency of analog OBIST using on-chip compensation of technology variations
Arbet, Daniel, Brenkus, Juraj, Gyepes, Gabor, Stopjakova, VieraYear:
2011
Language:
english
DOI:
10.1109/ddecs.2011.5783050
File:
PDF, 968 KB
english, 2011