![](/img/cover-not-exists.png)
Defect centers and optical absorption edge of degenerated semiconductor ZnO thin films grown by a reactive plasma deposition by means of piezoelectric photothermal spectroscopy
Sakai, K., Kakeno, T., Ikari, T., Shirakata, S., Sakemi, T., Awai, K., Yamamoto, T.Volume:
99
Year:
2006
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2173040
File:
PDF, 459 KB
english, 2006