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[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - Recovery Effects in the Distributed Cycling of Flash Memories
Mielke, Neal, Belgal, Hanmant, Fazio, Albert, Meng, Qingru, Righos, NickYear:
2006
Language:
english
DOI:
10.1109/relphy.2006.251188
File:
PDF, 297 KB
english, 2006