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[IEEE 2004 24th International Conference on Microelectronics - Nis, Serbia (16-19 May 2004)] 2004 24th International Conference on Microelectronics (IEEE Cat. No.04TH8716) - Effect of surface roughness on the properties of ohmic contacts to GaAs
Dmitruk, N.L., Borkovskaya, O.Yu., Kladko, V.P., Konakova, R.V., Kudryk, Y.Y., Lytvyn, O.S., Milenin, V.V.Volume:
2
Year:
2004
Language:
english
DOI:
10.1109/icmel.2004.1314872
File:
PDF, 320 KB
english, 2004