[IEEE ESSDERC 2013 - 43rd European Solid State Device...

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[IEEE ESSDERC 2013 - 43rd European Solid State Device Research Conference - Bucharest, Romania (2013.09.16-2013.09.20)] 2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - Threshold voltage extraction techniques and temperature effect in context of global variability in UTBB mosfets

Makovejev, S., Esfeh, B. Kazemi, Raskin, J.-P., Flandre, D., Kilchytska, V., Andrieu, F.
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Year:
2013
Language:
english
DOI:
10.1109/essderc.2013.6818852
File:
PDF, 598 KB
english, 2013
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