[IEEE IEEE 1986 Ultrasonics Symposium - Williamsburg, VA, USA (1986.11.17-1986.11.19)] IEEE 1986 Ultrasonics Symposium - A Hardware Digital Correlation Scheme for Ultrasonic Non-Destructive Testing in Explosive Environments
Gorfu, Y., Hayward, G.Year:
1986
Language:
english
DOI:
10.1109/ultsym.1986.198802
File:
PDF, 223 KB
english, 1986