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[IEEE 2007 International Conference on Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Systems. EuroSime 2007 - London, UK (2007.04.16-2007.04.18)] 2007 International Conference on Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Systems. EuroSime 2007 - A Modelling Framework for the Reliability of Safety Critical Electronics
Velandia, Diana Segura, Conway, Paul P., Wilson, Antony, West, Andrew A., Whalley, David C.Year:
2007
Language:
english
DOI:
10.1109/esime.2007.359970
File:
PDF, 6.25 MB
english, 2007