[IEEE 2011 First International Conference on Instrumentation, Measurement, Computer, Communication and Control (IMCCC) - Beijing, China (2011.10.21-2011.10.23)] 2011 First International Conference on Instrumentation, Measurement, Computer, Communication and Control - High Precision, Distributed and Parallel Automatic Test System for Slip-ring Contact Resistance
Xu, Liang, Deshun, Yan, Jian, Huang, Bigui, DongYear:
2011
Language:
english
DOI:
10.1109/imccc.2011.41
File:
PDF, 218 KB
english, 2011