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[IEEE 2010 IEEE International Integrated Reliability Workshop (IIRW) - S. Lake Tahoe, CA, USA (2010.10.17-2010.10.21)] 2010 IEEE International Integrated Reliability Workshop Final Report - Complexities of the non-volatile memory reliability testing caused by the test structure
Keshavarz, Abdol A., Spawn, Gregory S., Reyes, Nelson Delos, Mincitar, Rogelio, Dion, Laurent F.Year:
2010
Language:
english
DOI:
10.1109/iirw.2010.5706515
File:
PDF, 264 KB
english, 2010