[IEEE 2010 IEEE Applied Power Electronics Conference and Exposition - APEC 2010 - Palm Springs, CA, USA (2010.02.21-2010.02.25)] 2010 Twenty-Fifth Annual IEEE Applied Power Electronics Conference and Exposition (APEC) - Reliability evaluation of three-level inverters
Ding, Yi, Loh, Poh Chiang, Tan, Kuan Khoon, Wang, Peng, Gao, FengYear:
2010
Language:
english
DOI:
10.1109/APEC.2010.5433438
File:
PDF, 450 KB
english, 2010