[IEEE 2014 IEEE 29th International Conference on Microelectronics (MIEL) - Belgrade, Serbia (2014.5.12-2014.5.14)] 2014 29th International Conference on Microelectronics Proceedings - MIEL 2014 - Recoverable and permanent components of VT shift in pulsed NBT stressed p-channel power VDMOSFETs
Dankovic, D., Stojadinovic, N., Prijic, Z., Manic, I., Prijic, A.Year:
2014
Language:
english
DOI:
10.1109/miel.2014.6842147
File:
PDF, 258 KB
english, 2014