[IEEE International Symposium on VLSI Technology Systems...

  • Main
  • [IEEE International Symposium on VLSI...

[IEEE International Symposium on VLSI Technology Systems and Applications - Taipei, Taiwan (8-10 June 1999)] 1999 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers. (Cat. No.99TH8453) - Experimental investigation on the HBM ESD characteristics of CMOS devices in a 0.35-μm silicided process

Tung-Yang Chen,, Ming-Dou Ke,, Chung-Yu Wu,
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
1999
Language:
english
DOI:
10.1109/vtsa.1999.785993
File:
PDF, 372 KB
english, 1999
Conversion to is in progress
Conversion to is failed