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[IEEE 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - San Jose, CA, USA (April 17-21, 2005)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - Anomalous NMOSFET hot carrier degradation due to trapped positive charge in a DGO CMOS process
Brisbin, D., Mirgorodski, Y., Chaparala, P.Year:
2005
Language:
english
DOI:
10.1109/relphy.2005.1493097
File:
PDF, 1009 KB
english, 2005