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[IEEE 2010 International Conference on Electronic Devices, Systems and Applications (ICEDSA) - Kuala Lumpur, Malaysia (2010.04.11-2010.04.14)] 2010 International Conference on Electronic Devices, Systems and Applications - Characterization and optimizations of silicide thickness in 45nm pMOS device
Salehuddin, F., Ahmad, I., Hamid, F.A., Zaharim, A.Year:
2010
Language:
english
DOI:
10.1109/icedsa.2010.5503054
File:
PDF, 389 KB
english, 2010