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Identification of dislocation-related luminescence participating levels in silicon by DLTS and Pulsed-CL profiling
Bondarenko, Anton, Vyvenko, Oleg, Isakov, IvanVolume:
281
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/281/1/012008
Date:
February, 2011
File:
PDF, 594 KB
english, 2011