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Evaluation of Electrothermal Vaporization, Emission Intensity?Time?Wavelength Measurement and Time Resolution Combined With an Axially Viewed Horizontal Inductively Coupled Plasma Using an Echelle Spectrometer With Wavelength Modulation
NAKAMURA, YOSHISUKE, TAKAHASHI, KATSUYUKI, KUJIRAI, OSAMU, OKOCHI, HARUNOVolume:
12
Year:
1997
Language:
english
Journal:
Journal of Analytical Atomic Spectrometry
DOI:
10.1039/a605453f
File:
PDF, 639 KB
english, 1997