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[IEEE 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2011.11.7-2011.11.10)] 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - STT-RAM cell design optimization for persistent and non-persistent error rate reduction: A statistical design view

Zhang, Yaojun, Wang, Xiaobin, Chen, Yiran
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Year:
2011
Language:
english
DOI:
10.1109/iccad.2011.6105370
File:
PDF, 1.35 MB
english, 2011
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