[IEEE 1993 IEEE Instrumentation and Measurement Technology Conference - Irvine, CA, USA (18-20 May 1993)] 1993 IEEE Instrumentation and Measurement Technology Conference - The effects of process variations on microstrip wafer calibration
Walters, P.C., Pollard, R.D., Richardson, J.R., Byzery, B.M.Year:
1993
Language:
english
DOI:
10.1109/imtc.1993.382668
File:
PDF, 366 KB
english, 1993