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studied through polarized resonant x-ray diffraction
Bland, S. R., Angst, M., Adiga, S., Scagnoli, V., Johnson, R. D., Herrero-Martín, J., Hatton, P. D.Volume:
82
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.82.115110
Date:
September, 2010
File:
PDF, 1.33 MB
english, 2010