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Characterization and qualification of a neutron irradiation environment for neutron hardness assurance testing of electronic devices
Bennion, J.S., Sandquist, C.M., Kelly, J.C., Griffin, P.J., Sheehan, P.S., Saxey, B.L.Volume:
42
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.489231
Date:
January, 1995
File:
PDF, 1.08 MB
english, 1995