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[IEEE 2013 International Conference on IC Design & Technology (ICICDT) - Pavia, Italy (2013.05.29-2013.05.31)] Proceedings of 2013 International Conference on IC Design & Technology (ICICDT) - Impacts of single trap induced random telegraph noise on Si and Ge nanowire FETs, 6T SRAM cells and logic circuits
Yang, Shao-Yu, Chen, Yin-Nien, Fan, Ming-Long, Hu, Vita Pi-Ho, Su, Pin, Chuang, Ching-TeYear:
2013
Language:
english
DOI:
10.1109/icicdt.2013.6563303
File:
PDF, 430 KB
english, 2013