[IEEE 2011 IEEE 4th International Nanoelectronics Conference (INEC) - Tao-Yuan, Taiwan (2011.06.21-2011.06.24)] The 4th IEEE International NanoElectronics Conference - An observation of charge trapping phenomena in GaN/AlGaN/Gd2O3 MOS schottky structure
Das, Atanu, Be Chang, Liann, Lin, Ray Ming, Maikap, SiddheswarYear:
2011
Language:
english
DOI:
10.1109/inec.2011.5991688
File:
PDF, 265 KB
english, 2011