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[IEEE ESSDERC 2012 - 42nd European Solid State Device Research Conference - Bordeaux, France (2012.09.17-2012.09.21)] 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - Sensitivity-based investigation of threshold voltage variability in 32-nm flash memory cells
Bonfiglio, Valentina, Iannaccone, GiuseppeYear:
2012
Language:
english
DOI:
10.1109/essderc.2012.6343347
File:
PDF, 961 KB
english, 2012