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[IEEE ARFTG 63rd Conference, Spring 2004 - Fort Worth, TX (June 11, 2004)] ARFTG 63rd Conference, Spring 2004 - Base-band impedance control and calibration for on-wafer linearity measurements
Pelk, M.J., de Vreede, L.C.N., Spirito, M., Jos, J.H.Year:
2004
Language:
english
DOI:
10.1109/arftg.2004.1387852
File:
PDF, 380 KB
english, 2004