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[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - An improved capacitance measurement technique based of RC phase delay
Dean, Robert N., Rane, AditiYear:
2010
Language:
english
DOI:
10.1109/imtc.2010.5488213
File:
PDF, 3.96 MB
english, 2010