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[IEEE 58th DRC. Device Research Conference - Denver, CO, USA (19-21 June 2000)] 58th DRC. Device Research Conference. Conference Digest (Cat. No.00TH8526) - Recessed-gate GaN MESFET using ICP-RIE for high temperature microwave applications
Lee, C., Lu, W., Piner, E., Adesida, I.Year:
2000
Language:
english
DOI:
10.1109/drc.2000.877080
File:
PDF, 176 KB
english, 2000