Layout dependence of CMOS latchup
Menozzi, R., Selmi, L., Sangiorgi, E., Crisenza, G., Cavioni, T., Ricco, B.Volume:
35
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/16.7402
Date:
January, 1988
File:
PDF, 942 KB
english, 1988