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[IEEE 2010 IEEE Southwest Symposium on Image Analysis & Interpretation (SSIAI) - Austin, TX, USA (2010.05.23-2010.05.25)] 2010 IEEE Southwest Symposium on Image Analysis & Interpretation (SSIAI) - Extended character defect model for recognition of text from maps
Pezeshk, Aria, Tutwiler, Richard L.Year:
2010
Language:
english
DOI:
10.1109/ssiai.2010.5483913
File:
PDF, 1.55 MB
english, 2010