Measuring a Small Number of Samples, and the 3v Fallacy:...

IEEE Solid-State Circuits Magazine 2014 / 21 Vol. 6; Iss. 2

Measuring a Small Number of Samples, and the 3v Fallacy: Shedding Light on Confidence and Error Intervals

Schmid, Hanspeter, Huber, Alex
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Volume:
6
Language:
english
Journal:
IEEE Solid-State Circuits Magazine
DOI:
10.1109/mssc.2014.2313714
Date:
September, 2014
File:
PDF, 1.55 MB
english, 2014
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