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[IEEE Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Singapore (1999.07.9-1999.07.9)] Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - A comparison of interface trap generation by Fowler-Nordheim electron injection and hot-hole injection using the DCIV method
Ng, K.H., Jie, B.B., He, Y.D., Chim, W.K., Li, M.F., Lo, K.F.Year:
1999
Language:
english
DOI:
10.1109/ipfa.1999.791323
File:
PDF, 418 KB
english, 1999